X-Ray Reflectometry

Bruker D8 GADDS allows a user to configure setup to meet the requirements to perform the X-Ray Reflectometry experiments. In this technique electromagnetic radiation of extremely short wavelengths (~10−10 m) is reflected off the (multilayer) thin film and collected by a detector. Signal from thin layers create so called “Kiessig fringes” on diffractogram, which are characteristic for each material. Mathematical models for most popular materials are included in the LEPTOS software, which offers unprecedented options in terms of diffractogram analyses.